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atomic force microscope
(redirected from Atomic force microscopy)

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atomic force microscope

Microscope developed in the late 1980s that produces a magnified image using a diamond probe, with a tip so fine that it may consist of a single atom, dragged over the surface of a specimen to ‘feel’ the contours of the surface. In effect, the tip acts like the stylus of a record player, reading the surface. The tiny up-and-down movements of the probe are converted to an image of the surface by computer and displayed on a screen. The AFM is useful for examination of biological specimens since, unlike the scanning tunnelling microscope, the specimen does not have to be electrically conducting.



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Beyond GEM4, however, there are other consortia of mission-complementary higher ed partners now applying atomic force microscopy, laser tweezers, and nanoscale staples to spur new discoveries in human genome experimentation--fighting diseases like botulism, malaria, sickle cell anemia, and pancreatic cancer.
Scanning electron and atomic force microscopy was used for the first time to view the maturation of the severe acute respiratory syndrome-associated coronavirus at the cell surface.
His contributions in developing tapping phase and force modulation atomic force microscopy techniques and his image processing techniques are the mainstay characterization methods for quantification of polymer blends and composites, most importantly for examining rubber compound morphologies and filler phase distribution.
 
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