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charged particle beam

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charged particle beam

High-energy beam of electrons or protons. Such beams are being developed as weapons. See also beam weapon.
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FEI Company is a leading supplier of charged particle beam systems, including FIB systems, DualBeam systems, scanning and transmission electron microscopes, as well as components for the semiconductor, data storage, life sciences, and materials markets.
FEI Company Selects SRC Software's Advisor Series for Budgeting and ... by Business Wire
FEI Company (Nasdaq:FEIC) is a world leader in the design, manufacture, sale and support of charged particle beam systems and components including scanning and transmission electron microscopes (SEMs and TEMs) and focused ion beam (FIB) and DualBeam(tm) (FIB/SEM) systems.
Micron Force Instruments Bolsters Board of Directors by Business Wire
SELA, a manufacturer of automated SEM and TEM sample preparation systems for the semiconductor industry, today announced that it is partnering with FEI Company (Nasdaq: FEIC), a leading supplier of charged particle beam systems, to demonstrate a complete Transmission Electron Microscopy (TEM) sample preparation at the Microscopy & Microanalysis Expo.
FEI and SELA Partner to Provide Advanced TEM Sample Preparation by Business Wire
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